CREATE TABLE `pattern_dimension_info` (
  `log_id` bigint(20) NOT NULL COMMENT "",
  `wafer_id` varchar(64) NOT NULL COMMENT "",
  `data_source` int(11) NOT NULL COMMENT "数接类型 2 CP ,4 DEFECT ",
  `merge_level` int(11) NOT NULL COMMENT "CP的merge level , 0 test event ,1 test program,2 test type ,3 all, 4 defect",
  `wafer_pattern` varchar(100) NOT NULL COMMENT "wafer粒度pattern分为",
  `pattern_id` bigint(20) NULL COMMENT "pattern id主键",
  `model_version` varchar(255) NOT NULL COMMENT "模型版本",
  `wafer_pattern_ext` varchar(100) REPLACE_IF_NOT_NULL NULL COMMENT "wafer粒度pattern分类",
  `wafer_pattern_radius` double REPLACE_IF_NOT_NULL NULL COMMENT "wafer范围",
  `wafer_search_embedding` ARRAY<ARRAY<double>> REPLACE_IF_NOT_NULL NULL COMMENT "搜索向量",
  `pattern_name` varchar(64) REPLACE_IF_NOT_NULL NULL COMMENT "某个pattern 分类",
  `pattern_box` ARRAY<varchar(65533)> REPLACE_IF_NOT_NULL NULL COMMENT "pattern位置信息",
  `pattern_conf` double REPLACE_IF_NOT_NULL NULL COMMENT "pattern分类置信度",
  `pattern_description` varchar(65533) REPLACE_IF_NOT_NULL NULL COMMENT "",
  `pattern_complement` varchar(65533) REPLACE_IF_NOT_NULL NULL COMMENT "pattern补全信息",
  `update_time` datetime REPLACE_IF_NOT_NULL NULL COMMENT "入库时间",
  `test_flag` int(11) REPLACE_IF_NOT_NULL NULL COMMENT "指定log_id,data_source,merge_level,pattern_id下不同时间的排序",
  `box_points` ARRAY<varchar(65533)> REPLACE_IF_NOT_NULL NULL COMMENT "存检测框内的点信息",
  INDEX pattern_dime_wafer_id (`wafer_id`) USING BITMAP,
  INDEX pattern_dime_data_source (`data_source`) USING BITMAP,
  INDEX pattern_dime_merge_level (`merge_level`) USING BITMAP,
  INDEX pattern_dime_wafer_pattern (`wafer_pattern`) USING BITMAP
) ENGINE=OLAP 
AGGREGATE KEY(`log_id`, `wafer_id`, `data_source`, `merge_level`, `wafer_pattern`, `pattern_id`, `model_version`)
COMMENT "OLAP"
DISTRIBUTED BY HASH(`log_id`) BUCKETS 8 
PROPERTIES (
"replication_num" = "3",
"in_memory" = "false",
"storage_format" = "DEFAULT",
"enable_persistent_index" = "false",
"compression" = "LZ4"
);